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70, 71 & 72 Series - Disposable Probes
APT is a primary supplier to many OEM's for their disposable probes. This is due to the ... |
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73 Series - Low Current Probes
The 73 Series of coaxial probes are excellent for most low current applications. This series of probe ... |
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74 Series - Probe Holders
American Probe & Technologies offers a wide variety of probe holders. Almost too many to list, but ... |
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75 Series
Tungsten probe with integrated mounting shank of 0.040". Solid 20 mil
tungsten is attached to the 40 mil mounting shank. The tip is
electrochemically etch to the desired taper and radii.
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76 Series - Patch Cables
Coax Patch Cables available with a variety of cable types, connector styles, and
electrical configurations. If you don't see the cable and connector
configuration on this page,
Email
APT for a quotation
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78 Series - Mounting Adapters
Brackets, adapter, and many other accessories may be found here for interfacing your probing system to American Probe ... |
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79 Series
For those hard to find triax, coax, SMA, and SSMC adapters. Now you don't need to spend ... |
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86 Series
Triaxial Patch Cables available with a variety of cable types, connector styles,
and electrical configurations. If you don't see the cable and connector
configuration on this page,
Email
APT for a quotation
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Micropositioners
Micropositioners for General purpose to sub-micron probing solutions |
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IsoChuck
The newly announced ISO-CHUCK series was designed to improve the test performance required from the semiconductor industry. ... |
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Thermal Wafer Chucks
Looking for a heated wafer chuck for your prober? Begin here with several
standard and custom thermal wafer chucks for your existing or new analytical
prober. Models also available for many models of Electroglas, TEL, KLA
autoprobers.OPTIONS AVAILABLE:
Temperature range: -35 to 400 deg. C
Electrical config.: Standard, Coax, Triax, Kelvin, High Isolation
Mounting Styles for most analytical prober and auto-probers
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Probe Card
Characterization System
Turn-Key Probe Card Test Solution
- Leakage and
Capacitance Characterization of Blank or Populated Probe Cards
- Designed for Agilent
4070 Series or Keithley S600 Cards
- Reduces Down-Time by
Qualifying Probe Cards Without Having to Use Production Parametric Test System
- Allows Probe Card
Builders and Probe Rework Stations to Qualify Boards Prior to Production Use.
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Wirebonding
Accessories
Ambient work holders
Heated work holders
Temperature controllers
Wirebonding pull testers
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Surplus Equipment
Looking for something on the surplus market? The is not APTs' primary business, however from time to ... |
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Test
Software for the 4140 and 4062
INCLUDES 4062 INTERFACES AND PROBE CARDS
American Probe & Technologies is now offering software support for select DC parametric and materials leakage
analysis. |
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Ultrasonic Cutters
The UC-1000 Series of ultrasonic cutters offers an in-expensive way to provide analysis tools for FA lab
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