Product Catalog from American Probe & Technologies

American Probe & Technologies, Inc.
471 Montague Expressway,
Milpitas, CA 95035-6800
United States of America
Tel: 408 263-3356
Fax: 408 263-3797

Products


	70, 71 & 72 Series - Disposable Probes APT is a primary supplier to many OEM's for their disposable probes.


	73 Series - Low Current Probes The 73 Series of coaxial probes are excellent for most low current applications.


	74 Series - Probe Holders American Probe & Technologies offers a wide variety of probe holders.


	75 Series Tungsten probe with integrated mounting shank of 0.040". Solid 20 mil tungsten is attached to the 40 mil mounting shank. The tip is electrochemically etched to the desired taper and radii.


	76 Series - Patch Cables Coax Patch Cables available with a variety of cable types, connector styles, and electrical configurations. If you don't see the cable and connector configuration on this page, Email APT for a quote .


	78 Series - Mounting Adapters Brackets, adapter, and many other accessories may be found here for interfacing your probing system to American Probe.


	79 Series For those hard to find triax, coax, SMA, and SSMC adapters.


	86 Series Triaxial Patch Cables available with a variety of cable types, connector styles, and electrical configurations. If you don't see the cable and connector configuration on this page, Email APT for a quote .


	Micropositioners Micropositioners for general purpose to sub-micron probing solutions.


	IsoChuck The newly announced ISO-CHUCK Series was designed to improve the test performance required from the semiconductor industry.


	Thermal Wafer Chucks Looking for a heated wafer chuck for your prober? Begin here with several standard and custom thermal wafer chucks for your existing or new analytical prober. Models also available for many series of Electroglas, TEL, KLA autoprobers. OPTIONS AVAILABLE: Temperature range: -35 to 400 deg. C. Electrical configuration: Standard, Coax, Triax, Kelvin, High Isolation Mounting Styles for most analytical prober and auto-probers.


	Probe Card Characterization System Turn-Key Probe Card Test Solution Leakage and capacitance characterization of blank or populated probe cards. Designed for Agilent 4070 Series or Keithley S600 cards. Reduces down-time by qualifying probe cards without having to use Production ParametricTest System. Allows probe card builders and probe rework stations to qualify boards prior to production use.


	Wirebonding Accessories Ambient workholders Heated workholders Wirepull testers Heater controllers


	Surplus Equipment Looking for something on the surplus market? From time to time we have something extra you may be looking for.


	Test Software for the 4140 and 4062 INCLUDES 4062 INTERFACES AND PROBE CARDS American Probe & Technologies is now offering software support for select DC parametric and materials leakage analysis.


	Ultrasonic Cutters The UC-1000 Series of ultrasonic cutters offers an inexpensive way to provide analysis tools for FA lab.

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