American Probe & Technologies, Inc.
471 Montague Expressway, Milpitas, California 95035-6800 United States of America Tel: 408 263-3356
Fax: 408 263-3797 |
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Probe Card
Characterization System
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Turn-Key Probe Card Test Solution
- Leakage and
Capacitance Characterization of Blank or Populated Probe Cards
- Designed for Agilent
4070 Series or Keithley S600 Cards
- Turn-Key Solution with
No Operator Intervention (During Test)
- Provides Hardcopy
Printout of Leakage/Capacitance Characterization for QC Compliance
- Reduces Down-Time by
Qualifying Probe Cards Without Having to Use Production Parametric Test System
- Allows Probe Card
Builders and Probe Rework Stations to Qualify Boards Prior to Production Use.
- Can be used with
Agilent 4156, 4140B, Keithley 4200, 6517A SMU’s for Leakage Measurements, and
Agilent 4284/4285 LCR For Capacitance Measurements
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