American Probe & Technologies, Inc.
471 Montague Expressway, Milpitas, CA 95035-6800 United States of America Tel: 408 263-3356
Fax: 408 263-3797 |
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Probe Card
Characterization System
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Turn-Key Probe Card Test Solution:
- Leakage and
capacitance characterization of blank or populated probe cards.
- Designed for Agilent
4070 Series or Keithley S600 cards.
- Turn-Key Solution with
no operator intervention (during test).
- Provides hardcopy
printout of leakage/capacitance characterization for QC compliance educes down-time by
qualifying probe cards without having to use the Production Parametric Test System.
- Allows probe card
builders and probe rework stations to qualify boards prior to production use.
- Can be used with
Agilent 4156, 4140B, Keithley 4200, and 6517A SMU’s for leakage measurements, and
Agilent 4284/4285 LCR for capacitance measurements.
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