Turn-Key Probe Card Test Solution:

• Leakage and capacitance characterization of blank or populated probe cards.
• Designed for Agilent 4070 Series or Keithley S600 cards.
• Turn-Key Solution with no operator intervention (during test).
• Provides hardcopy printout of leakage/capacitance characterization for QC compliance educes down-time by qualifying probe cards without having to use the Production Parametric Test System.
• Allows probe card builders and probe rework stations to qualify boards prior to production use. 
• Can be used with Agilent 4156, 4140B, Keithley 4200, and 6517A SMU’s for leakage measurements, and Agilent 4284/4285 LCR for capacitance measurements.

PCCS flyer

PCCS Specifications/Options