APT Home Page
Probing Solutions
Products
Contact Information
Inquiry Form
Shopping Cart
Policies/Statements
Web Links
 

American Probe & Technologies, Inc.
471 Montague Expressway,
Milpitas, CA 95035-6800
United States of America
Tel: 408 263-3356
Fax: 408 263-3797

 
Probing Solutions
 

Product Photos:

 
                                       

*The pictures on this page require a high bandwidth internet connection to work.

 

73APT-100K Series "True Kelvin" probe


74CJA-APT-KS low current probeholder accepts replaceable 20 mil shank probes. Excellant for use with Paliney 7 and BeCu probe tips.


74CJ-APT-KS Low Current Coax Probeholders with a replaceable coax probe (73CT) and 34 mil tungsten probe (70T). A litz wire provides ground return.


LP600MB Linear Micropositioner with Course "Z" tilt and swivel probe arm mount. Shown with 74CJ low noise coax probe.


Chip resistor mounting onto 73CT series coax probe. BeCu probe is the contact material.


High Voltage version of 74B-1HV


DC Probeholer (74B-1 x .8") mounted into 78-RFUM Series mount. Allows DC probeholder mounting into RF mount, for cost effective probing.


IsoChuck Series of high performance wafer chuck. Shown is a 300mm chuck designed for a Suss Microtec prober (Coaxial).


IsoChuck Series of high performance wafer chuck. Shown is a 6" chuck designed for a SemiProbe prober (Triaxial).


Wire bonding workholder with thermal controller


Wire bonding workholder


Wire bonding workholder (vacuum device holddown) with thermal controller


HC-6000 Series of Thermal Chuck with custom quartz surface for high temperature probing


HC6008 Custom high terperature quartz surface thermal chuck



Back to Probing Solutions Page     Flyers and Downloads

 
APT Home Page ] Probing SolutionsProducts ] [ Contact Information ] [ Inquiry Form ]
Shopping Cart ] [ Policies/Statements ] [ Web Links ]