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American Probe & Technologies, Inc.
471 Montague Expressway,
Milpitas, CA 95035-6800
United States of America
Tel: 408 263-3356
Fax: 408 263-3797

 
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Software for the I-V Analysis
 

American Probe & Technologies is now offering software support for select DC parametric and materials leakage analysis.

 

Software
 

Probe-IV

 Virtual Front Panel Operation of 4140B for I-V & CV Analysis.

USD495.00


ProbeIV   ←Press for more information
This new series of software allows you to analyze materials or semiconductor leakage with all of the capabilities of your HP 4140B to resolutions of 1 fA @ 100VDC.

Quantity
GPIB Card
 

ISO-IV Material Analysis - High Voltage Leakage test using the  Keithley 237 Series HV SMU
The Iso-IV Series of software allows you to analyze leakage of materials and semiconductor devices to 1KV.  Utilizing 2 Keithley 237 series of high voltage SMU's allow differential voltage/leakage measurements to 2KV with 10 fA resolution.

4062 Software & Enhancement


 

American Probe & Technologies in conjunction with White Eagle Consulting offers a complete Test Solution for custom 4062 Systems Software. Contact APT or WEC to learn more about custom systems programming available.


 
 

  
  
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