PCW Series High Current Wedge Probe

This series of wedge probe offers customization for high current and low contact resistance probing applications.

Due to the device specific applications, APT would need to have the device contact drawing to provide a quotation for your specific requirements.

These drawing and specifications should include the following:

  • Physical mounting needs
  • custom physical size and dimension requirements
  • target contact resistance
  • choice of probe materials
  • choice of connector and contact pins
  • any passive of active component layout and consideration requirements

 

Applications include:

  • Solar device analysis
  • High current automotive and aerospace analysis
  • Military IC analysis
  • Materials research