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![73APT-100K Series "True Kelvin" probe](photogallery/thumbnail112.jpg) |
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73APT-100K Series "True Kelvin" probe
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![74CJA-APT-KS low current probeholder accepts replaceable 20 mil shank probes. Excellant for use with Paliney 7 and BeCu probe tips.](photogallery/thumbnail115.jpg) |
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74CJA-APT-KS low current probeholder accepts replaceable 20 mil shank probes. Excellant for use with Paliney 7 and BeCu probe tips.
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![74CJ-APT-KS Low Current Coax Probeholders with a replaceable coax probe (73CT) and 34 mil tungsten probe (70T). A litz wire provides ground return.](photogallery/thumbnail118.jpg) |
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74CJ-APT-KS Low Current Coax Probeholders with a replaceable coax probe (73CT) and 34 mil tungsten probe (70T). A litz wire provides ground return.
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![LP600MB Linear Micropositioner with Course "Z" tilt and swivel probe arm mount. Shown with 74CJ low noise coax probe.](photogallery/thumbnail11B.jpg) |
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LP600MB Linear Micropositioner with Course "Z" tilt and swivel probe arm mount. Shown with 74CJ low noise coax probe.
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![Chip resistor mounting onto 73CT series coax probe. BeCu probe is the contact material.](photogallery/thumbnail11E.png) |
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Chip resistor mounting onto 73CT series coax probe. BeCu probe is the contact material.
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![High Voltage version of 74B-1HV](photogallery/thumbnail121.JPG) |
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High Voltage version of 74B-1HV
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![DC Probeholer (74B-1 x .8") mounted into 78-RFUM Series mount. Allows DC probeholder mounting into RF mount, for cost effective probing.](photogallery/thumbnail124.JPG) |
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DC Probeholer (74B-1 x .8") mounted into 78-RFUM Series mount. Allows DC probeholder mounting into RF mount, for cost effective probing.
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![IsoChuck Series of high performance wafer chuck. Shown is a 300mm chuck designed for a Suss Microtec prober (Coaxial).](photogallery/thumbnail127.JPG) |
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IsoChuck Series of high performance wafer chuck. Shown is a 300mm chuck designed for a Suss Microtec prober (Coaxial).
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![IsoChuck Series of high performance wafer chuck. Shown is a 6" chuck designed for a SemiProbe prober (Triaxial).](photogallery/thumbnail12A.JPG) |
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IsoChuck Series of high performance wafer chuck. Shown is a 6" chuck designed for a SemiProbe prober (Triaxial).
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![Wire bonding workholder with thermal controller](photogallery/thumbnail12D.jpg) |
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Wire bonding workholder with thermal controller
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![Wire bonding workholder (vacuum device holddown) with thermal controller](photogallery/thumbnail133.JPG) |
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Wire bonding workholder (vacuum device holddown) with thermal controller
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![HC-6000 Series of Thermal Chuck with custom quartz surface for high temperature probing](photogallery/thumbnail136.JPG) |
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HC-6000 Series of Thermal Chuck with custom quartz surface for high temperature probing
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![HC6008 Custom high terperature quartz surface thermal chuck](photogallery/thumbnail139.JPG) |
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HC6008 Custom high terperature quartz surface thermal chuck
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