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Turn-Key Probe Card Test Solution

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WEC-PCCS

Features
Leakage and capacitance characterization of blank or populated probe cards.
Designed for Agilent 4070 Series or Keithley S600 cards.
Turn-Key Solution with no operator intervention (during test).
Provides hardcopy printout of leakage/capacitance characterization for QC compliance educes down-time by qualifying probe cards without having to use the Production Parametric Test System.
Allows probe card builders and probe rework stations to qualify boards prior to production use. 
Can be used with Agilent 4156, 4140B, Keithley 4200, and 6517A SMU’s for leakage measurements, and Agilent 4284/4285 LCR for capacitance measurements.

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